By Gautier C.   Perinet J.   Nissou E.   Laffitte D.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1761-1766

Elsevier‎(2003)‎

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By Goudard J.L.   Boddaert X.   Perinet J.   Laffitte D.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1767-1769

Elsevier‎(2003)‎

Access to resources Favorite 7.504105

By Van de Casteele J.   Laffitte D.   Gelly G.   Starck C.   Bettiati M.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1751-1754

Elsevier‎(2003)‎

Access to resources Favorite 6.2603364

By Mendizabal L.   Verneuil J.L.   Bechou L.   Aupetit-Berthelemot C.   Deshayes Y.   Verdier F.   Dumas J.M.   Danto Y.   Laffitte D.   Goudard J.L.   Hernandez Y.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1743-1749

Elsevier‎(2003)‎

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