By Knauss L.A.   Orozco A.   Woods S.I.   Cawthorne A.B.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1657-1662

Elsevier‎(2003)‎

Access to resources Favorite 10.023931

By Woods S.I.   Jung T.M.   Ly G.T.   Yu J.   in Metrologia

ISSN:0026-1394|49|6|737-744

IOP Publishing‎(2012)‎

Access to resources Favorite 8.576761

By Tomlin N A   White M   Vayshenker I   Woods S I   Lehman J H   in Metrologia

ISSN:0026-1394|52|2|376-383

IOP Publishing‎(2015)‎

Access to resources Favorite 2.8943386