By Bergmans R H   Nieuwenkamp H J   Kok G J P   Blobel G   Nouira H   Küng A   Baas M   Tevoert M   Baer G   Stuerwald S   in Measurement Science and Technology

ISSN:0957-0233|26|10|105004-105011

IOP Publishing‎(2015)‎

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