By Pahl B.   Kallmayer C.   Aschenbrenner R.   Reichl H.   in Microelectronics Reliability

ISSN:0026-2714|44|2|309-314

Elsevier‎(2004)‎

Access to resources Favorite 6.778116

By Christiaens W.   Loeher T.   Pahl B.   Feil M.   Vandevelde B.   Vanfleteren J.   in Circuit World

ISSN:0305-6120|34|3|3-8

Emerald Group Publishing Ltd‎(2008)‎

Access to resources Favorite 5.6543217