Author: Sayil Selahattin Borra Uday Kiran
Publisher: Taylor & Francis Ltd
ISSN: 1362-3060
Source: International Journal of Electronics, Vol.96, Iss.4, 2009-04, pp. : 351-366
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Mitigation for single event coupling delay
By Sayil Selahattin Akkur Abhishek
International Journal of Electronics, Vol. 97, Iss. 1, 2010-01 ,pp. :
The Coupling Model for Function and Delay Faults
By Yi Joonhwan
Journal of Electronic Testing, Vol. 21, Iss. 6, 2005-12 ,pp. :
Efficient multicast search under delay and bandwidth constraints
Wireless Networks, Vol. 12, Iss. 6, 2006-12 ,pp. :
False-Path Removal Using Delay Fault Simulation
Journal of Electronic Testing, Vol. 16, Iss. 5, 2000-10 ,pp. :