International Scientific and Engineering Conference Sensor Electronics and Microsystem Technologies (SEMST-1) with Exhibition of Sensor Developments and Production Samples

Author:  

Publisher: MAIK Nauka/Interperiodica

ISSN: 1061-8309

Source: Russian Journal of Nondestructive Testing, Vol.39, Iss.6, 2003-06, pp. : 493-495

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract