Transport characterization in nanowires using an electrical nanoprobe

Author： Talin A A   Léonard F   Katzenmeyer A M   Swartzentruber B S   Picraux S T   Toimil-Molares M E   Cederberg J G   Wang X   Hersee S D   Rishinaramangalum A  

Publisher： IOP Publishing

ISSN： 0268-1242

Source： Semiconductor Science and Technology, Vol.25, Iss.2, 2010-02, pp. : 24015-24023

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