

Author: Vovk R. Zavgorodniy A. Obolenskii M. Goulatis I. Chroneos A. Pinto Simoes V.
Publisher: Springer Publishing Company
ISSN: 0957-4522
Source: Journal of Materials Science: Materials in Electronics, Vol.22, Iss.1, 2011-01, pp. : 20-24
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content




By Prikhna T.A. Gawalek W. Sandiumenge F. Moshchil V.E. Melnikov V.S. Dub S.N. Habisreuther T. Surzhenko A.B. Nagorny P.A.
Journal of Materials Science, Vol. 35, Iss. 7, 2000-04 ,pp. :




By Castello P. Costa G.A. Ferretti M. Olcese G.L. Pilot A. Zucchi E.
Journal of Materials Science, Vol. 33, Iss. 3, 1998-02 ,pp. :