Publisher: IOP Publishing
ISSN: 1742-6596
Source: Journal of Physics: Conference Series , Vol.26, Iss.1, 2006-02, pp. : 37-41
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Piezo control for 1 nm spatial resolution synchrotron X-ray microscopy
Journal of Physics: Conference Series , Vol. 493, Iss. 1, 2014-03 ,pp. :
XPEEM valence state imaging of mineral micro-intergrowthswith a spatial resolution of 100 nm
Le Journal de Physique IV, Vol. 104, Iss. issue, 2003-03 ,pp. :
By Beaty-Travis L.M. Moule D.C. Liu H. Lim E.C. Judge R.H.
Journal of Molecular Spectroscopy, Vol. 205, Iss. 2, 2001-02 ,pp. :