Interface State Density Evaluation of p‐Type and n‐Type Ge/GeNx Structures by Conductance Technique

E-ISSN： 1520-6440|98|6|8-15

ISSN： 1942-9533

Source： ELECTRONICS & COMMUNICATIONS IN JAPAN, Vol.98, Iss.6, 2015-06, pp. : 8-15

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