Author: Kusiak A. Battaglia J.-L. Gomez S. Manaud J.-P. Lepetitcorps Y.
Publisher: Edp Sciences
E-ISSN: 1286-0050|35|1|17-27
ISSN: 1286-0042
Source: EPJ Applied Physics (The), Vol.35, Iss.1, 2006-06, pp. : 17-27
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
Growth of single-phase Cu(In, Al)S2 thin films by thermal evaporation
By Smaïli F.
EPJ Applied Physics (The), Vol. 54, Iss. 1, 2011-04 ,pp. :
By Kumar Gadipelly Anil Ramana Reddy Musugu Narasimha Reddy Katta
EPJ Applied Physics (The), Vol. 68, Iss. 1, 2014-10 ,pp. :
The design of high-temperature thermal conductivity measurements apparatus for thin sample size
MATEC Web of conference, Vol. 101, Iss. issue, 2017-03 ,pp. :