Nano-Scale Measurements of Dopants and Electronic Impurities in Individual Silicon Nanowires Using Kelvin Probe Force Microscopy
( Nanowires - Implementations and Applications )
Publication series ： Nanowires - Implementations and Applications
Author： Elad Koren Jonathan E. Allen Uri Givan Noel Berkovitch5
Publisher： IntechOpen
Publication year： 2011
E-ISBN: INT0102519333
P-ISBN(Paperback): 9789533073187
P-ISBN(Hardback): 9789533073187
Subject： O469 Condensed Matter Physics
Keyword： 凝聚态物理学
Language： ENG
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Nano-Scale Measurements of Dopants and Electronic Impurities in Individual Silicon Nanowires Using Kelvin Probe Force Microscopy