Numerical study of the systematic error in Monte Carlo schemes for semiconductors

Author: Muscato Orazio   Wagner Wolfgang   Di Stefano Vincenza  

Publisher: Edp Sciences

E-ISSN: 1290-3841|44|5|1049-1068

ISSN: 0764-583x

Source: ESAIM: Mathematical Modelling and Numerical Analysis, Vol.44, Iss.5, 2010-08, pp. : 1049-1068

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