Publisher: Springer Publishing Company
Founded in: 1990
Total resources: 50
E-ISSN: 1573-0727
ISSN: 0923-8174
Subject:
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Journal of Electronic Testing
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Counterfeit Integrated Circuits: Detection, Avoidance, and the Challenges Ahead
By Guin Ujjwal,DiMase Daniel,Tehranipoor Mohammad in (2014)
Journal of Electronic Testing , Vol. 30, Iss. 1, 2014-02 , pp.By Ren Y.,He A.-L.,Shi S.-T.,Guo G.,Chen L.,Wen S.-J.,Wong R.,Vonno N.,Bhuva B. in (2014)
Journal of Electronic Testing , Vol. 30, Iss. 1, 2014-02 , pp.Applications of Boolean Satisfiability to Verification and Testing of Switch-Level Circuits
By Favalli M.,Dalpasso M. in (2014)
Journal of Electronic Testing , Vol. 30, Iss. 1, 2014-02 , pp.Clock Faults Induced Min and Max Delay Violations
By Rossi D.,Omaña M.,Cazeaux J.,Metra C.,Mak T. in (2014)
Journal of Electronic Testing , Vol. 30, Iss. 1, 2014-02 , pp.Simulation Based Framework for Accurately Estimating Dynamic Power-Supply Noise and Path Delay
By Kadiyala Rao Sushmita,Robucci Ryan,Patel Chintan in (2014)
Journal of Electronic Testing , Vol. 30, Iss. 1, 2014-02 , pp.By Rekik Ahmed,Azaïs Florence,Mailly Frédérick,Nouet Pascal in (2014)
Journal of Electronic Testing , Vol. 30, Iss. 1, 2014-02 , pp.Wide Dynamic Range CMOS Amplifier Design for RF Signal Power Detection via Electro-Thermal Coupling
By Feng Junpeng,Onabajo Marvin in (2014)
Journal of Electronic Testing , Vol. 30, Iss. 1, 2014-02 , pp.By Zhang Bei,Agrawal Vishwani in (2014)
Journal of Electronic Testing , Vol. 30, Iss. 1, 2014-02 , pp.