Post-annealing Effect on Microstructures and Thermoelectric Properties of Bi 0.45 Sb 1.55 Te 3 Thin Films Deposited by Co-sputtering

Author: Song Junqiang  

Publisher: Springer Publishing Company

ISSN: 1543-186X

Source: Journal of Electronic Materials, Vol.41, Iss.11, 2012-11, pp. : 3068-3072

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Abstract