Epitaxial and thermal strains in oxidic thin films on Si(001)

Author: Wecker J.   Samwer K.   Bardal A.   Matthe T.  

Publisher: Elsevier

ISSN: 0040-6090

Source: Thin Solid Films, Vol.258, Iss.1, 1995-03, pp. : 264-267

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Abstract