Innovative Built-In Self-Test Schemes for On-Chip Diagnosis, Compliant with the IEEE 1149.4 Mixed-Signal Test Bus Standard

Author: Ducoudray-Acevedo G.O.  

Publisher: Springer Publishing Company

ISSN: 0923-8174

Source: Journal of Electronic Testing, Vol.19, Iss.1, 2003-02, pp. : 21-28

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Abstract