AFM/FTIR: A New Technique for Materials Characterization

Author: Boerio F. J.   Starr M. J.  

Publisher: Taylor & Francis Ltd

ISSN: 0021-8464

Source: Journal of Adhesion, Vol.84, Iss.10, 2008-10, pp. : 872-895

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

Previous Menu Next

Abstract