Characterization of ZrO2 and SiC ceramic thin films prepared by electrostatic atomization

Author: Miao P.   Balachandran W.   Xiao P.  

Publisher: Springer Publishing Company

ISSN: 0022-2461

Source: Journal of Materials Science, Vol.36, Iss.12, 2001-06, pp. : 2925-2930

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