Author: BAE B. LIM J. YOO D. NAM S. HEO J. IM D. CHO B. PARK S. KIM H. CHUNG U. MOON J.
Publisher: Taylor & Francis Ltd
ISSN: 1058-4587
Source: Integrated Ferroelectrics, Vol.75, Iss.1, 2005-10, pp. : 235-241
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Abstract