Perturbation approach of the injection effect on the electron-beam-induced current efficiency in lightly doped semiconductors

Author： Tarento R. J.   Mekki D. E.   Tabet N.  

Publisher： Taylor & Francis Ltd

ISSN： 1463-6417

Source： Philosophical Magazine B, Vol.80, Iss.7, 2000-07, pp. : 1347-1358

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