Author: Beillard B. Chevalier Y. Andrieu J. Imbs Y. Jecko B.
Publisher: Edp Sciences
E-ISSN: 1286-0050|4|3|297-302
ISSN: 1286-0042
Source: EPJ Applied Physics (The), Vol.4, Iss.3, 2010-03, pp. : 297-302
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