Atomic disorder of Li0.5Ni0.5O thin films caused by Li doping: estimation from X‐ray Debye–Waller factors

Publisher： John Wiley & Sons Inc

E-ISSN： 1600-5767|48|6|1896-1900

ISSN： 0021-8898

Source： JOURNAL OF APPLIED CRYSTALLOGRAPHY (ELECTRONIC), Vol.48, Iss.6, 2015-12, pp. : 1896-1900

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