Characterization method of the valence states : Application to dielectrics and metal-dielectrics interfaces

E-ISSN： 1764-7177|08|PR9|Pr9-33-Pr9-42

ISSN： 1155-4339

Source： Le Journal de Physique IV, Vol.08, Iss.PR9, 1998-12, pp. : Pr9-33-Pr9-42

Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.

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