TEV—A Program for the Determination of the Thermal Expansion Tensor from Diffraction Data

Author： Langreiter Thomas   Kahlenberg Volker  

Publisher： MDPI

E-ISSN： 2073-4352|5|1|143-153

ISSN： 2073-4352

Source： Crystals, Vol.5, Iss.1, 2015-02, pp. : 143-153

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