Author: Schönenberger J.
Publisher: Springer Publishing Company
ISSN: 0195-928X
Source: International Journal of Thermophysics, Vol.33, Iss.2, 2012-02, pp. : 342-362
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
A miniature XRD/XRF instrument for in-situ characterization of Martian soils and rocks
Le Journal de Physique IV, Vol. 08, Iss. PR5, 1998-10 ,pp. :
By Koralay Tamer Kadıoğlu Yusuf Kağan Jiang Shao-Yong
Spectroscopy Letters, Vol. 46, Iss. 7, 2013-10 ,pp. :
Applications of an Integrated XRF-XRD Spectrometer
Le Journal de Physique IV, Vol. 06, Iss. C4, 1996-07 ,pp. :
Examination of CoNiCu thin films by using XRF and XRD
By Söğüt Ö. Dönük Ç. Apaydın G. Bakkaloğlu Ö.F.
Canadian Journal of Physics, Vol. 92, Iss. 5, 2014-01 ,pp. :
Combining XRD and XRF analysis in one Rietveld-like fitting
Powder Diffraction, Vol. 32, Iss. S1, 2017-04 ,pp. :