X-ray diffraction topography observations of the core in Bi 12 SiO 20 crystals doped with Mn

Author: Milenov T.I.   Botev P.A.   Rafailov P.M.   Gospodinov M.M.  

Publisher: Elsevier

ISSN: 0921-5107

Source: Materials Science and Engineering: B, Vol.106, Iss.2, 2004-01, pp. : 148-154

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