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The sensitivity limits of spectroscopic ellipsometry to oxygen content in YBa 2 Cu 3 O 7- thin films

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In-situ annealing effect of sputter-deposited Nd 1 Ba 2 Cu 3 O 7- thin films

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Growth and characterization of Pb(Zr,Ti)O 3 thin films and ferroelectric polarization charging of YBa 2 Cu 3 O 7 thin films

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Normal metal, ohmic contacts to high-temperature superconducting YBa 2 Cu 3 O 7- thin films suitable for multichip modules

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