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The microstructure of thin films observed using atomic force microscopy

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Measuring the thermal properties of photoresist thin films using atomic force microscopy

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Characterization of polyacrylonitrile films grafted onto nickel by ellipsometry, atomic force microscopy and X-ray reflectivity

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In-situ atomic force microscopy and transmission electron microscopy observations of the deformation of MC2 nickel-based superalloy gamma phase

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