Author: Koranne S.
Publisher: Springer Publishing Company
ISSN: 0923-8174
Source: Journal of Electronic Testing, Vol.18, Iss.4-5, 2002-08, pp. : 415-434
Disclaimer: Any content in publications that violate the sovereignty, the constitution or regulations of the PRC is not accepted or approved by CNPIEC.
Abstract
Related content
On Concurrent Test of Core-Based SOC Design
By Huang Y.
Journal of Electronic Testing, Vol. 18, Iss. 4-5, 2002-08 ,pp. :