Journal de Physique Appliqué,volume 23,issue S3  (03-1962)

Period of time： 1962年S3期

Publisher： Edp Sciences

Founded in： 1998

Total resources： 27

E-ISSN： 1160-8161|23|S3

ISSN： 1160-8161

Subject： O4 Physics

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Journal de Physique Appliqué,volume 23,issue S3

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Luminance waves in electroluminescent cells.

Journal de Physique Appliqué,volume 23,issue S3 , Vol. 23, Iss. S3, 1962-03 , pp. 1-6

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Relation between temperature and evaporation pressure.

Journal de Physique Appliqué,volume 23,issue S3 , Vol. 23, Iss. S3, 1962-03 , pp. 7-12

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Measurement of [high-current] intensities with coil.

Journal de Physique Appliqué,volume 23,issue S3 , Vol. 23, Iss. S3, 1962-03 , pp. 13-14

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Apparatus for the measurement of thermal conductivity of semiconductors I. General ; method of fluxmeters

Journal de Physique Appliqué,volume 23,issue S3 , Vol. 23, Iss. S3, 1962-03 , pp. 15-20

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Paramagnetic resonance spectrometer for the measurement of relaxation times.

Journal de Physique Appliqué,volume 23,issue S3 , Vol. 23, Iss. S3, 1962-03 , pp. 21-24

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Kinetic measurement of temperatures.

Journal de Physique Appliqué,volume 23,issue S3 , Vol. 23, Iss. S3, 1962-03 , pp. 25-32

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Low-voltage supply with transistorized servo-mechanism.

Journal de Physique Appliqué,volume 23,issue S3 , Vol. 23, Iss. S3, 1962-03 , pp. 33-36

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Measurement of molecular flow leaking form a mass spectrometer.

Journal de Physique Appliqué,volume 23,issue S3 , Vol. 23, Iss. S3, 1962-03 , pp. 37-39

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Production of square pulses by means of transistors in the avalanche mode.

Journal de Physique Appliqué,volume 23,issue S3 , Vol. 23, Iss. S3, 1962-03 , pp. 40-42

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Book reviews

Journal de Physique Appliqué,volume 23,issue S3 , Vol. 23, Iss. S3, 1962-03 , pp. 42-42

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