By O’Brien Kory T   Ölçmen Semih M   in Measurement Science and Technology

ISSN:0957-0233|25|7|75206-75213

IOP Publishing‎(2014)‎

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By Nott Cameron   Ölçmen Semih   Karr Charles   Trevino Luis   in Applied Intelligence

ISSN:0924-669X|26|3|251-265

Springer Publishing Company ‎(2007)‎

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