By Soussan P.   Lekens G.   Dreesen R.   De Ceuninck W.   Beyne E.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1785-1790

Elsevier‎(2003)‎

Access to resources Favorite 6.8919315

By Carchon G.J.   Raedt W De   Beyne E   in Microelectronics International

ISSN:1356-5362|20|1|26-30

Emerald Group Publishing Ltd‎(2003)‎

Access to resources Favorite 2.1149616