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By Martin J.C.   Maneux C.   Labat N.   Touboul A.   Riet M.   Blayac S.   Kahn M.   Godin J.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1725-1730

Elsevier‎(2003)‎

Access to resources Favorite 5.987093

 

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