By RyuS   CapellC   Van BruntE   JonasC   O’LoughlinM   ClaytonJ   LamK   PalaV   HullB   LemmaY   LichtenwalnerD   ZhangQ J   RichmondJ   ButlerP   GriderD   CasadyJ   AllenS   PalmourJ   HinojosaM   TiptonC W   ScozzieC   in Semiconductor Science and Technology

ISSN:0268-1242|30|8|84001-84007

IOP Publishing‎(2015)‎

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