By Charpenel P.   Davenel F.   Digout R.   Giraudeau M.   Glade M.   Guerveno J.   Guillet N.   Lauriac A.   Male S.   Manteigas D.   Meister R.   Moreau E.   Perie D.   Relmy-Madinska F.   Retailleau P.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1401-1404

Elsevier‎(2003)‎

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