By Kim K.   Chuang C.-T.   Rim K.   Joshi R.V.   in Solid-State Electronics

ISSN:0038-1101|48|2|239-243

Elsevier‎(2004)‎

Access to resources Favorite 10.523541

By Kuang J. B.   Saccamango M. J.   Ratanaphanyarat S.   Chuang C.-T.   in International Journal of Electronics

ISSN:1362-3060|91|11|625-637

Taylor & Francis Ltd‎(2004)‎

Access to resources Favorite 8.658582

By Chuang C. T.   Lu P. F.   Anderson C. J.   in International Journal of Electronics

ISSN:1362-3060|86|1|55-66

Taylor & Francis Ltd‎(1999)‎

Access to resources Favorite 3.663447

By Rodriguez R.   Stathis J.H.   Linder B.P.   Joshi R.V.   Chuang C.T.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1439-1444

Elsevier‎(2003)‎

Access to resources Favorite 2.9307575

By Hwang W.   Chuang C. T.   Curran B. W.   Rosenfield M. G.   in International Journal of Electronics

ISSN:1362-3060|89|4|267-275

Taylor & Francis Ltd‎(2002)‎

Access to resources Favorite 2.9307575

By Tretz C.   Chuang C. T.   Terman L.   Anderson C.   Pelella Mario   Zukowski C.   in International Journal of Electronics

ISSN:1362-3060|86|7|807-813

Taylor & Francis Ltd‎(1999)‎

Access to resources Favorite 2.9307575