By Huang Y.   Simoen E.   Claeys C.   Rafí J.   Clauws P.   in Journal of Materials Science: Materials in Electronics

ISSN:0957-4522|18|7|705-710

Springer Publishing Company ‎(2007)‎

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By Ohyama H.   Hayama K.   Takakura K.   Jono T.   Simoen E.   Claeys C.   in Microelectronic Engineering

ISSN:0167-9317|66|1|530-535

Elsevier‎(2003)‎

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By Ohyama H.   Takakura K.   Shigaki K.   Kuboyama S.   Matsuda S.   Simoen E.   Claeys C.   in Microelectronic Engineering

ISSN:0167-9317|66|1|536-541

Elsevier‎(2003)‎

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By Nakabayashi M.   Ohyama H.   Simoen E.   Ikegami M.   Claeys C.   Kobayashi K.   Yoneoka M.   Miyahara K.   in Thin Solid Films

ISSN:0040-6090|406|1|195-199

Elsevier‎(2002)‎

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By Simoen E.   Claeys C.   Sioncke S.   Steenbergen J.   Meuris M.   Forment S.   Vanhellemont J.   Clauws P.   Theuwis A.   in Journal of Materials Science: Materials in Electronics

ISSN:0957-4522|18|7|799-804

Springer Publishing Company ‎(2007)‎

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By Ohyama H.   Simoen E.   Claeys C.   Takami Y.   Sunaga H.   Yoneoka M.   Nakabayashi M.   Kobayashi K.   Kudou T.   in Thin Solid Films

ISSN:0040-6090|364|1|259-263

Elsevier‎(2000)‎

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By Ohyama H.   Hayama K.   Takakura K.   Miura T.   Shigaki K.   Jono T.   Simoen E.   Poyai A.   Claeys C.   in Microelectronic Engineering

ISSN:0167-9317|66|1|517-521

Elsevier‎(2003)‎

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By Takakura K.   Ohyama H.   Murakawa H.   Yoshida T.   Rafí J. M.   Job R.   Ulyashin A.   Simoen E.   Claeys C.   in EPJ Applied Physics (The)

ISSN:1286-0042|27|1-3|133-135

Edp Sciences‎(2010)‎

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