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By Dufrene Y.F.   Boonaert C.J.P.   van der Mei H.C.   Busscher H.J.   Rouxhet P.G.   in Ultramicroscopy

ISSN:0304-3991|86|1|113-120

Elsevier‎(2001)‎

Access to resources Favorite 9.059134

 

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