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By Andriamonje G.   Pouget V.   Ousten Y.   Lewis D.   Danto Y.   Rampnoux J.M.   Ezzahri Y.   Dilhaire S.   Grauby S.   Claeys W.   Rossignol C.   Audoin B.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1803-1807

Elsevier‎(2003)‎

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