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ISSN:1360-2381|7|2|79-92

Routledge Ltd‎(2000)‎

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By Faure D.   Bru D.   Ali C.   Giret C.   Christensen K.   in Microelectronics Reliability

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Elsevier‎(2003)‎

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By Schneider D.   Faure D.   Noirclerc-Savoye M.   Barrière A-C.   Coursange E.   Blot M.   in Plasmid

ISSN:0147-619X|44|2|201-207

Academic Press‎(2000)‎

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