By Muratet S.   Fourniols J.   Soto-Romero G.   Endemano A.   Marty A.   Desmulliez M.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1945-1949

Elsevier‎(2003)‎

Access to resources Favorite 6.4558372

By Schmitt P.   Pressecq F.   Lafontan X.   Duong Q.H.   Pons P.   Nicot J.M.   Oudea C.   Esteve D.   Fourniols J.Y.   Camon H.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1957-1962

Elsevier‎(2003)‎

Access to resources Favorite 1.2624795