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By Schmitt P.   Pressecq F.   Lafontan X.   Duong Q.H.   Pons P.   Nicot J.M.   Oudea C.   Esteve D.   Fourniols J.Y.   Camon H.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1957-1962

Elsevier‎(2003)‎

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