By Coppeta R.A.   Holec D.   Ceric H.   Grasser T.   in Philosophical Magazine

ISSN:1478-6443|95|2|186-209

Taylor & Francis Ltd‎(2015)‎

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By Ayalew T.   Gehring A.   Park J.M.   Grasser T.   Selberherr S.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1889-1894

Elsevier‎(2003)‎

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