By Howell S.W.   Acoff V.L.   in Practical Failure Analysis

ISSN:1529-8159|3|6|63-73

Springer Publishing Company ‎(2003)‎

Access to resources Favorite 12.3825

By Lee S.I.   Howell S.W.   Raman A.   Reifenberger R.   in Ultramicroscopy

ISSN:0304-3991|97|1|185-198

Elsevier‎(2003)‎

Access to resources Favorite 10.204783