By Busatto G.   Iannuzzo F.   Velardi F.   Valentino M.   Pepe G.P.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1907-1912

Elsevier‎(2003)‎

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By Velardia F.   Iannuzzo F.   Busatto G.   Wyss J.   Sanseverino A.   Candelori A.   Curro G.   Cascio A.   Frisina F.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1847-1851

Elsevier‎(2003)‎

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