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By Shintani T.   Nakamura K.   Hosaka S.   Hirotsune A.   Terao M.   Imura R.   Fujita K.   Yoshida M.   Kammer S.   in Ultramicroscopy

ISSN:0304-3991|61|1|285-289

Elsevier‎(1995)‎

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