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By Trinh S.   Mergens M.   Verhaege K.   Russ C.   Armer J.   Jozwiak P.   Keppens B.   Mohn R.   Taylor G.   De Ranter F.   Van Camp B.   in Microelectronics Reliability

ISSN:0026-2714|43|9|1537-1543

Elsevier‎(2003)‎

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