By Han M.S.   Kang P.W.   Choi D.H.   Lee Y.H.   Choi S.K.   Yoon S.R.   Shin D.J.   Kim J.M.   Jin H.J.   Kwak K.D.   Kim W.   in Forensic Science International

ISSN:0379-0738|123|2|230-231

Elsevier‎(2001)‎

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