By Vovk V.   Schmitz G.   Kirchheim R.   in Microelectronic Engineering

ISSN:0167-9317|70|2|533-538

Elsevier‎(2003)‎

Access to resources Favorite 9.307778

By Borchers C.   Laudahn U.   Pundt A.   Fahler S.   Krebs H. U.   Kirchheim R.   in Philosophical Magazine. A. Physics of Condensed Matter. Defects and Mechanical Properties

ISSN:0141-8610|80|3|543-553

Taylor & Francis Ltd‎(2000)‎

Access to resources Favorite 6.3510194